Fujitsu Laboratories of America,
595 Lawrence Expressway, Sunnyvale,
In this talk, we provide techniques for fault and error diagnosis based on capturing unmodeled faulty behavior. We present a technique for capturing all possible faulty behaviors that can be generated from specific sets of nodes (called X-lists in this talk) in the circuit. Since all possible erroneous behaviors are captured, this provides a way for drawing powerful diagnostic inferences about the presence of faults at these sets of nodes when analyzing the observed faulty responses. We also present an efficient diagnosis algorithm that exploits the modeling of all possible behaviors and can be built in a framework of conventional test and simulation tools. Experimental results with numerous diagnosis experiments are then used to demonstrate that the techniques developed can indeed be used to achieve significant improvements in the accuracy of diagnosis.
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