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Test Program Generator Tool

Lectured if time permits:

A test program generator works out a short sequence of tests that will reveal `stuck-at' and other faults in a subsystem.

The wafer (six to ten inches diameter) is diced into chips (1cm on a side or so).
The wafer (six to ten inches diameter) is diced into chips (1cm on a side or so).

General configuration of a wafer probe testing machine (not showing the wafer conveyers that load a new undiced wafer every few minutes.
General configuration of a wafer probe testing machine (not showing the wafer conveyers that load a new undiced wafer every few minutes.

Probe needles just visible inside testing load card.
Probe needles just visible inside testing load card.

Drawing of the test load card.
Drawing of the test load card.
4: (C) 2008-18, DJ Greaves, University of Cambridge, Computer Laboratory.