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Test Program Generator Tool

Lectured if time permits:

A test program generator works out a short sequence of tests that will reveal `stuck-at' and other faults in a subsystem.

The wafer (six to ten inches diameter) is diced into chips (1cm on a side or so).

General setup with wafer probe testing machine.

Probe needles just visible inside testing load card.

Drawing of the test load card.

6: (C) 2008-13, DJ Greaves, University of Cambridge, Computer Laboratory.