NEXT (Scan Path Insertion and JTAG standard test port.)
Test Program Generator Tool
Lectured if time permits:
A test program generator works out a short sequence of tests that
will reveal `stuck-at' and other faults in a subsystem.
The wafer (six to ten inches diameter) is diced into chips (1cm on a side or so).
General setup with wafer probe testing machine.
Probe needles just visible inside testing load card.
Drawing of the test load card.